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Dr. L. P. Allen

Epion Corp.

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Affiliated Awards

Award Title Agency Phase Award amount Start Date End Date
Gate Oxide Screening Methodology and Surface Smoothing for Advanced SOI Space System Applications
Epion Corp.
Principal Investigator
AF 2 $776K 07/12/00 07/12/02
Gate Oxide Screening Methodology and Surface Smoothing for Advanced SOI Space System Applications
Epion Corp.
Principal Investigator
AF 1 $100K 04/27/99 01/27/00