Uncopiers, Inc.

910 Poyntz Ave
Manhattan, KS 66502
http://[email protected]
3 Employees

SBIR Award Summary

Total Number of Awards 17
Total Value of Awards $3.57MM
First Award Date 01/01/99
Most Recent Award Date 01/01/12

Key Personnel

Last Name Name Awards Contact
Madanshetty Dr. Sameer I. Madanshetty 9 Message
Zambrano Dr. Isabel Zambrano 4 Message
Taft William Taft 1
Ji Hang Ji 4 Message
He Bingrong He 1 Message

17 Awards Won

Phase 2 SBIR

Agency: National Science Foundation
Topic: NM-2012
Budget: 01/01/12 - 12/31/12
PI: Hang Ji

This Small Business Innovation Research (SBIR) Phase II project aims to develop a single wafer processing clean tool for semiconductor wafer cleaning at all stages of wafer processing. The method relies on using acoustically controlled micro-cavitation to remove on-wafer particles. This is a chemical-free cleaning method, using ultra-pure water ...

Phase 1 SBIR

Agency: National Science Foundation
Topic: IC-2010
Budget: 01/01/11 - 12/31/11

This SBIR Phase-I project is to develop an acoustic CMP (Chemical Mechanical Polishing) slurry monitor?a fully in-line, real-time, point of use instrument that will detect and disperse any and all large agglomerates in the nanofine slurries used in IC manufacture. Left unchecked, these errant slurry particles/ agglomerates can "kill" (deeply scr...

Phase 1 SBIR

Agency: National Science Foundation
Topic: NM/-2010
Budget: 01/01/10 - 12/31/10

This Small Business Innovation Research (SBIR) Phase I project, will develop a new kind of wafer cleaning tool that will be useful at every cleaning step in semiconductor processing. It will use an environmentally friendly, acoustic technology that uses only clean water and silent sound. The tool will clean a wafer by simultaneously detecting a...

Phase 2 SBIR

Agency: National Science Foundation
Topic: 2008
Budget: 01/01/08 - 12/31/08
PI: Hang Ji

The Small Business Innovation Research (SBIR) Phase II project seeks to develop an innovative, environment friendly method for removing resist from semiconductor wafers. After every lithography step, and the following processing step, e.g., etching or ion implantation, the process-hardened resist must be stripped away and the wafer cleaned. Exi...

Phase 1 SBIR

Agency: National Science Foundation
Topic: 2008
Budget: 01/01/08 - 12/31/08

This SBIR Phase I project is to develop a Chemical Mechanical Polishing (CMP) Slurry Monitor as a fully in-line, real-time, point of use instrument that will detect and disperse large agglomerates in the nanofine slurries used in IC manufacture. The monitor will not only detect scratch inducing agglomerates but will also attempt to destroy them...

Phase 2 SBIR

Agency: National Science Foundation
Topic: 2007
Budget: 01/01/07 - 12/31/07

This Small Business Innovation Research (SBIR) Phase II Project concerns Ultrapure Water (UPW), the life blood of the semiconductor industry. The proposed instrument seeks to satisfy the ITRS requirements on two counts: 1. full flow inspection, and 2. detection of sub-100nm liquid-borne particles. 1. A typical semiconductor fab uses about 3 mill...

Phase 1 SBIR

Agency: National Science Foundation
Topic: 2006
Budget: 01/01/06 - 12/31/06
PI: Hang Ji

This Small Business Innovation Research (SBIR) Phase I Project seeks to develop an innovative method for removing resist from semiconductor wafers. The Microcavitation Resist Remover will help enable the low-k integration critical to the next generation of faster chips. Microcavitation will be a mechanical removal process influenced by the mecha...

Phase 1 SBIR

Agency: National Science Foundation
Topic: 2005
Budget: 01/01/05 - 12/31/05

This Small Business Innovation Research (SBIR) Phase I project concerns Ultrapure Water (UPW), the lifeblood of the semiconductor industry. The proposed instrument seeks to satisfy the International Technology Roadmap for Semiconductors (ITRS) requirements on two counts: 1. full flow inspections, 2. detection of sub-100nm liquid-borne particles....

Phase 2 SBIR

Agency: National Science Foundation
Topic: 2004
Budget: 01/01/04 - 12/31/04

This Small Business Innovation Research (SBIR) Phase II project will develop a new method of determining how strong a thin film anchors to a substrate. The ACIM deBonder(trade mark)uses controlled microcavitation to directly reveal a thin film's adhesion strength by subjecting it to controlled erosion. ACIM is a means of constructively controlli...

Phase 1 SBIR

Agency: National Science Foundation
Topic: 2003
Budget: 01/01/03 - 12/31/03

This Small Business Innovation Research (SBIR) Phase I project will develop a new method of measuring how strongly a thin film anchors to its substrate. To date no method exists that can truly measure thin film adhesion. The Acoustic Coaxing Induced Microcaviation (ACIM) deBonder uses controlled microcavitation to directly reveal a thin film's a...

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