GMA Industries, Inc.

60 West Street, Suite 203
Annapolis, MD 21401
http://www.gmai.com
24 Employees

SBIR Award Summary

Total Number of Awards 55
Total Value of Awards $18.1MM
First Award Date 01/01/95
Most Recent Award Date 09/28/07

55 Awards Won

Phase 2 SBIR

Agency: Air Force
Topic: AF05-275
Budget: 09/28/07 - 09/27/09

Electronic component failure occurs at three distinct levels: chip or device level, circuit board, and the interconnection between device and circuit board. Current non-invasive techniques for circuit board testing provide prognostic capabilities and replace the functional stimulus tests employed in electronic component performance evaluation. H...

Phase 2 SBIR

Agency: Navy
Topic: N05-093
Budget: 05/03/07 - 05/03/09

This project explores new methods that can dramatically improve the ability to accurately predict the useful life remaining for individual digital printed circuit boards at any particular point in time. The proposed capability will improve the system maintainers ability to identify marginal circuit boards and components, and to replace them pri...

Phase 2 SBIR

Agency: Air Force
Topic: AF05-268
Budget: 12/10/06 - 11/10/08

This proposal describes an approach for a non-invasive system of inspection that capitalizes on the advancing technology of three dimensional (3D) digital X-ray laminography and digital tomosynthesis in providing an automatic and non-destructive means of inspection for a device under test while allowing for high fault coverage of all pins. Newly...

Phase 2 SBIR

Agency: Air Force
Topic: AF05-276
Budget: 12/10/06 - 10/14/08

This proposal describes an approach to revolutionize present day testing methods through the development of an automated means for the creation of a test program set utilizing electric and electromagnetic emissions from integrated circuits to determine UUT operational status. Electric and electromagnetic emissions from rapidly changing voltages ...

Phase 2 SBIR

Agency: Air Force
Topic: N03-158
Budget: 07/28/06 - 07/07/07

Advances in nanotechnology and imaging, using Terahertz (THz) radiation and other techniques, are applied to create a completely new method for evaluating electronic circuit cards. These technologies are used to implement a complementary testing methodology that utilizes the strengths of each approach to investigate a broad range of physical, el...

Phase 1 SBIR

Agency: Navy
Topic: N05-093
Budget: 11/10/05 - 05/10/06

This proposal explores new methods that can improve the ability to accurately predict the useful life remaining for individual digital circuit boards at any particular point in time. The capability proposed herein will improve the system maintainers' ability to identify marginal circuit boards and components, and to replace them prior to their a...

Phase 2 SBIR

Agency: Navy
Topic: N04-262
Budget: 08/17/05 - 08/17/07

The goal of this project is to develop a terahertz-based instrument for performing Nondestructive Evaluation of composite structures that could be used during all phases of the life of the material. All phases of life of a composite part means during manufacture (both pre- and post-cure), damage evaluation and bonded repair evaluation. Teraher...

Phase 1 SBIR

Agency: Air Force
Topic: AF05-268
Budget: 05/09/05 - 02/09/06

This proposal describes efforts planned for the design and development of a non-intrusive method for the inspection of electronic systems and components using X-ray digital laminography and tomosynthesis. This approach provides a non-destructive means for the inspection of a device under test while enabling high fault coverage of all pins, which...

Phase 1 SBIR

Agency: Air Force
Topic: AF05-275
Budget: 05/09/05 - 02/09/06

Electronic component failure occurs at three distinct levels: chip or device level, circuit board, and the interconnection between device and circuit board. Current non-invasive techniques for circuit board testing provide prognostic capabilities and replace the functional stimulus tests employed in electronic component performance evaluation. H...

Phase 1 SBIR

Agency: Air Force
Topic: AF05-276
Budget: 05/09/05 - 02/09/06

This proposal describes the automated development of a test program set utilizing electromagnetic emissions from integrated circuits to determine UUT operational status. Electromagnetic emissions from rapidly changing voltages and currents within high-speed logic and other circuits have traditionally been seen as a problematic source of electrom...

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