The Characterization and Mitigation of Radiation Effects on Nano-technology Microelectronics

Period of Performance: 04/19/2011 - 11/18/2011

$100K

Phase 1 SBIR

Recipient Firm

Orora Design Technologies, Inc.
18378 Redmond Fall CIty Road
Redmond, WA 98052
Principal Investigator

Abstract

OBJECTIVE: The successful outcome of this effort will support the use of ultra-deep submicron integrated circuits in DoD satellite systems that will result in very significant savings in weight, power and reliability for systems that include Space Radar, Space Tracking and Surveillance Systems and others. In addition, this effort will also support the use of compound semiconductor technologies (e.g. antimony based compound semiconductors, indium phosphide, and others) in these systems and their introduction into advanced spacecraft and missile systems with similar savings in both power and weight, coupled with increased performance. DESCRIPTION: Current satellite systems are fabricated using a mix of commercial and radiation hardened circuits. However, the use of advanced commercial integrated circuits devices results in added complexity to mitigate radiation effects that can result in the mis-operation and/or destruction of devices. In many cases, the penalties in increased power, area, weight and added circuit complexity out-weigh any potential benefits and preclude the use of the advanced commercial technology. Moreover, these technologies have demonstrated sensitivity to radiation effects. The present methods to mitigate radiation effects, while proven to be effective at circuit geometries > 150nm silicon based technology, have been shown to be less effective when applied to integrated circuit feature sizes below 100nm silicon based and compound semiconductor technologies. In addition, the introduction of new technologies, e.g. quantum function circuits, will require the development of new mitigation approaches. Thus, if minimally invasive methods such as the use of alternative materials, circuit enhancements, and other innovative approaches could be developed to reduce radiation effects sensitivity these devices could be used with little or no penalties. Therefore, the basic approach to accomplish this task would be to leverage commercial microelectronics at the