The Characterization and Mitigation of Single Event Effects in Ultra-Deep Submicron (< 90nm) Microelectronics

Period of Performance: 09/09/2008 - 09/08/2010

$750K

Phase 2 SBIR

Recipient Firm

Orora Design Technologies, Inc.
18378 Redmond Fall CIty Road
Redmond, WA 98052
Principal Investigator

Abstract

Orora Design Technologies proposes to develop electronic design automation (EDA) tools employing minimally invasive circuit design-based methods to mitigate single event effects (SEEs) for next generation Ultra-DSM CMOS (