The Characterization and Mitigation of Single Event Effects in Ultra-Deep Submicron (< 90nm) Microelectronics

Period of Performance: 06/06/2007 - 12/05/2007


Phase 1 SBIR

Recipient Firm

Orora Design Technologies, Inc.
18378 Redmond Fall CIty Road
Redmond, WA 98052
Principal Investigator


Orora Design Technologies proposes the development of minimally invasive circuit design-based methods to mitigate single event effects (SEEs) in next generation Ultra-DSM CMOS (