Development of Technologies for Environmental Stress Screening of Electronic Circuit Card Assemblies

Period of Performance: 07/20/1994 - 01/20/1995


Phase 1 SBIR

Recipient Firm

Space Coast Testing
260 N. Wickham Road
Melbourne, FL 32935
Principal Investigator

Research Topics


Proposer Space Coast Testing (SCT) and its aerospace affiliates will: 1. Analyze and evaluate Environmental Stress Simulation (ESS) and Automatic Test Equipment (ATE) methods used to stress/test specific high value, critical use CCAs for various USAF applications. 2. Determine base causes of selected CCA failures that are: a.) Operational Environment(s) Stress (OES) related. b.) ATE test process related. c.) Due to sources other than ESS and/or ATE. 3. Determine technical limits of present ESS/ATE procedures preventing identification, and/or prediction of OES related CCA failures. 4. Based on ESS/ATE analyses, SCT recommends either: a.) Series of engineering changes to current CCAs/ESS/ATE(s), or b.) Performance parameters of a new ESS/ATE systems and procedures cost effective configuration using COTS hardware/software whereever possible/but, without degrading ESS/ATE capabilities to identify OES and other classes of CCA failures during testing. SCT's overall technical objectives are to show how: 1. ATE staff can analyze CCAs to component level, inclusive of ESS in ATE procedures. 2. CTA recommendations will reduce by 50% the present number of post-test CCA environmental stress related failures.