Correlated Multi-Sensor “Target Chip” Generator and Target Constructor for ATR in Arbitrary Background Clutter Environments

Period of Performance: 05/05/2006 - 02/05/2007


Phase 1 SBIR

Recipient Firm

JRM Enterprises, Inc.
1127 International Parkway, Suite 115 Array
Fredericksburg, VA 22406
Principal Investigator


JRM Technologies proposes to develop the Correlated Multi-Sensor Target Chip Generator for ATR and Feature Extraction in Arbitrary Background Clutter Environments, an innovative new approach for generating credible libraries of target signature chips as a function of user-defined angles and resolutions, passband (visible, IR, SAR and MTI), sensor specifications (frequency, optics, etc.) and clutter type (forested, desert, urban, etc.). This Target Chip Generation Toolkit (TCGT) will leverage JRM s comprehensive Xpatch scatter centers technology-- called Universal Scatter Center Sets (USCSs) -- that advances Xpatch scattering technology to define the RF response of an object from any arbitrary transmitter or receiver (bi-static) direction. It will provide the Air Force with the capability to generate fast, high-fidelity, physics-based RF scenes for the detection and identification of moving and stationary targets in arbitrarily-complex background clutter. The TCGT will be a scalable-fidelity-performance simulation system that will not only generate target chip libraries, but can be used for the exploration of multi-sensor suites and ATR algorithms with the goal of improving SAR sensor and processing development for target detection, recognition, and fusion applications. Additionally, JRM will develop an advanced feature extraction capability to allow for the extraction of critical targets from complex sensor imagery.