Low Z-Strain Gage

Period of Performance: 08/30/1991 - 08/30/1993


Phase 2 SBIR

Recipient Firm

Aptek, Inc.
1257 Lake Plaza Drive, Suite 100
Colorado Springs, CO 80906
Principal Investigator


This activity will further PVDF film for use as a low Z sensitive strain gage. Building on the feasiblity demonstrated in the Phase I progrram, Phase II will provide a production gage design and optimized signal recording instrumentation. The production designs will be calibrated over a temperature range of -50 degrees C to 90 degrees C, and up to 5% strain. The production design will undergo radiation response testing as a qualification for underground testing (UGT). Also to be performed is a verification of the gage in a UGT. To support commercial development as part of Phase III, a marketing plan for the gage will be developed jointly with commercial partners.