An Embedded Health Monitoring System for Determining Readiness of Electronic Components

Period of Performance: 09/19/2016 - 09/18/2018


Phase 2 STTR

Recipient Firm

Nokomis, Inc.
310 5th St. Array
Charleroi, PA 15022
Firm POC
Principal Investigator

Research Institution

University of Toledo
2801 West Bancroft Street
Toledo, OH 43606
Institution POC


The MDA is in need of a robust, holistic Electronics Health Monitoring (EHM) solution that can address mission readiness concerns. Nokomis solution to this problem provides unique information to operators and maintainers and a more complete picture of component readiness. Nokomis novel methodologies for determining device health, whereby changes in unintended RF emissions signatures are leveraged to assess device health, provides unique value by identifying degradation in electronic components and assessing their Remaining Useful Life (RUL), in addition to the environmental assessments provided by Micro-Electro-Mechanical System (MEMS) devices. The Phase II effort will focus on building a prototype Hiawatha-MEMS health monitoring system. Specific goals of this effort are to prototype the Hiawatha-MEMS sensor system through integration of customized MEMS sensors with the Hiawatha SoC architecture. Nokomis will demonstrate the ability to detect degradation of MDA-critical BMDS subcomponents using the Hiawatha-MEMS system. This Phase II effort will lay the foundation for a robust electronics health monitoring system implementation in Phase III that assures mission readiness and cuts costs associated with BMDS maintenance activities.