Ultrafast Optical Switches for Eccm

Period of Performance: 06/01/1991 - 06/01/1992

$411K

Phase 2 SBIR

Recipient Firm

Gumbs Assoc., Inc.
11 HARTS LANE
East Brunswick, NJ 08816
Principal Investigator

Abstract

ADDRESSING THE CRITICAL NEED FOR PROTECTION OF ECM DEVICES FROM HAZARDOUS LASER RADIATION IN COMBAT SITUATIONS, THE NOVEL TECHNOLOGY SET FORTH HEREIN INTERFACES INORGANIC SEMICONDUCTOR (SC) MATERIALS TO CONDUCTING POLYMERS (CPs) TO ACHIEVE ULTRAFAST, PASSIVE SWITCHING OF THE CPs. IN THE PHASE I WORK, THE VIABILITY OF SC/CP INTERFACE SWITCHING FOR INTENSITIES AS LOW AS 80 uJ/cm2 WAS EMINENTLY DEMONSTRATED, WITH RISE-TIMES IN THE SUB-ns REGIME AND FALL-TIMES ALSO RAPID. THE PHASE II WORK WILL INVOLVE A MUCH MORE EXTENSIVE EFFORT COMMENCING WITH THE SCREENING OF A LARGE NUMBER OF PROMISING POLYMERS, INCLUDING PROCESSIBLE AND REFLECTIVE MATERIALS, AND A LARGE NUMBER OF SCs. MORPHOLOGICAL OPTIMIZATION WILL YIELD LONGCHAIN POLYMER WITH PERPENDICULAR ORIENTATION TO THE SC, IDEAL FOR COMPLETE SWITCHING. EXTENDED PULSED LASER STUDIES, DURING THE FIRST, UNCLASSIFIED YEAR, OF SELECTED SC/CP INTERFACES AT THE REGIONAL LASER & BIOTECHNOLOGY LABORATORIES (RLBL), U. OF PA., A STATE-OF-THEART NATIONAL LASER FACILITY, WILL YIELD METHODS TO OPTIMIZE SWITCHIED OD. DURING THE SECOND, CLASSIFIED YEAR, CW STUDIES WILL BE CONDUCTED IN-HOUSE AT GUMBS, AND EXTENSIVE PROTOTYPE DEVICE TESTING (INCLUDING LASER THRESHOLDS AND ENVIRONMENTAL TESTING) WILL BE CONDUCTED IN CONJUNCTION WITH THE CONTRACT MONITOR. THE TYPICAL TEST DEVICE WILL BE A SINGLE SC/CP INTERFACE SUITABLY PACKAGED AND HERMETICALLY SEALED.